发明名称 FOREIGN MATTER INSPECTION DEVICE AND FOREIGN MATTER INSPECTION METHOD
摘要 <p>Disclosed are a foreign matter inspection device and a foreign matter inspection method, in which the accurate inspection of foreign matter is performed using captured images by continuous shooting in the state in which a movement locus due to the falling caused by the movement of the foreign matter along the inner wall of a container from the horizontal direction of the container as a result of rotation is formed so as to be long. A rotating device is provided with a rotation control means for executing the rotational motion in which container holding members for holding the container in a horizontal manner or at a constant inclination angle relative to the horizontal axis of the container, and the container are rotated at an angle of 60° or more, and then stopped, wherein a foreign matter detection means detects the foreign matter according to the movement locus of the foreign matter, which is formed using the captured images obtained by the continuous shooting for each rotational motion at constant time.</p>
申请公布号 EP2579028(A1) 申请公布日期 2013.04.10
申请号 EP20110789685 申请日期 2011.05.26
申请人 HITACHI INFORMATION & CONTROL SOLUTIONS, LTD. 发明人 FUKUDA, HIROHISA;ASANO, KUNITAKA;KATANE, TADAHIRO;YAMAZAKI HIROMI
分类号 G01N21/90 主分类号 G01N21/90
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