发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a bonded wafer which is inexpensive and excels in productivity without complicating polishing work, and can easily control the thickness of an active layer in a desired standard. <P>SOLUTION: This method of manufacturing a bonded wafer includes: a process (S1) of bonding a supporting wafer to a wafer for an active layer to form a bonded body; a process (S2) of processing the side of the wafer for an active layer of the bonded body to form an active layer having a first thickness; a process (S3) of sticking, to a polishing plate, a plurality of the bonded bodies each having the active layer formed thereon to polish the active layers to a second thickness; a process (S4) of optically measuring the second thickness in a state where the polished bonded bodies are stuck to the polishing plate; and a process (S5) of re-polishing the active layers to a third thickness based on the measured second thickness. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5181214(B2) 申请公布日期 2013.04.10
申请号 JP20110034549 申请日期 2011.02.21
申请人 发明人
分类号 H01L21/304;B24B37/07;B24B49/12 主分类号 H01L21/304
代理机构 代理人
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