发明名称 THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF
摘要 <p>A TFT 20 includes a gate electrode 21, a gate insulating film 22, a semiconductor layer 23, a source electrode 24, a drain electrode 25, etc. The semiconductor layer 23 is comprised of a metal oxide semiconductor (IGZO), and has a source portion 23a that contacts the source electrode 24, a drain electrode 23b that contacts the drain electrode 25, and a channel portion 23c that is located between the source and drain portions 23a, 23b. A reduced region 30 is formed at least in the channel portion 23c of the semiconductor layer 23, and the reduced region 30 has a higher content of a simple substance of a metal such as In than the remaining portion of the semiconductor layer 23.</p>
申请公布号 EP2579316(A1) 申请公布日期 2013.04.10
申请号 EP20110789404 申请日期 2011.05.23
申请人 SHARP KABUSHIKI KAISHA 发明人 MORIGUCHI, MASAO;TAKEI, MICHIKO;KANZAKI, YOHSUKE;INOUE, TSUYOSHI;FUKAYA, TETSUO;TAKANISHI, YUDAI;KUSUMI, TAKATSUGU;NAKATANI, YOSHIKI;OKAMOTO, TETSUYA;NAKANISHI, KENJI
分类号 H01L29/786;H01L29/24;H01L29/66 主分类号 H01L29/786
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