发明名称 |
Methods, apparatus and articles of manufacture to diagnose temperature-induced memory errors |
摘要 |
Example methods, apparatus and articles of manufacture to diagnose temperature-induced memory errors are disclosed. A disclosed example method to diagnose a temperature-induced memory error includes detecting a memory error associated with a memory device, and writing a highest measured temperature of the memory device in the memory device when the memory error is detected, the highest temperature measured temporally near the detected memory error. |
申请公布号 |
US8418005(B2) |
申请公布日期 |
2013.04.09 |
申请号 |
US20100775307 |
申请日期 |
2010.05.06 |
申请人 |
DEPEW KEVIN G.;BROWN ANDREW;HARSANY JOHN S.;HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. |
发明人 |
DEPEW KEVIN G.;BROWN ANDREW;HARSANY JOHN S. |
分类号 |
G11C29/08;G01R31/28 |
主分类号 |
G11C29/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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