发明名称 |
METHOD FOR CIRCUIT SIMULATION |
摘要 |
PURPOSE: A circuit simulation method is provided to use a net list and a waveform with a digital value, thereby increasing error inspection speed for a circuit and performing various error inspections. CONSTITUTION: A net list is generated for a designed circuit, and the operation of the circuit is simulated by using the generated net list(S300). Errors in the circuit are inspected by using the net list and the waveform which is generated in a simulation step(S400). Errors in the circuit are inspected by using the inspection control information and the waveform. [Reference numerals] (AA) Start; (BB) End; (S100) Circuit design; (S200) Net list generation; (S300) Circuit simulation; (S400) Circuit error inspection using a waveform generated in net list and simulation; |
申请公布号 |
KR20130035555(A) |
申请公布日期 |
2013.04.09 |
申请号 |
KR20110099919 |
申请日期 |
2011.09.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MIN, SEONG UK;PARK, SANG HO;YUN, YEO IL |
分类号 |
G06F9/455;G01R31/28 |
主分类号 |
G06F9/455 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|