| 摘要 |
PURPOSE: A semiconductor package sorting apparatus and a test handler using the same are provided to implement the hemi spherical trace movement of a lower outlet by separating a sorter unit into a fixed upper side and a lower side which is a free end and to facilitate a smooth diagonal movement with the increase of a rotary angle, thereby remarkably shortening time necessary for the each sorting of a semiconductor package as well as maintaining the high reliability of equipment even if equipment is used for a long time. CONSTITUTION: A sorting apparatus receives a semiconductor package moved from shooters(34,35) through a sorter unit(43) and discharges the semiconductor package by moving the outlet(43d) of the sorter unit to one among multiple sorting holes(49a) formed in a sorting plate(49) according to class information in a test result delivered from a package test unit(30). A holding fixture(41) is installed in one side of the sorting plate. The upper side head part(43a) of the sorter unit connected to the upper side of the holding fixture is fixed, and the lower side follower(43c) of the sorter unit is a free end, in order to enable a flexible change in the angle of the lower side follower and to facilitate a hemi spherical trace movement of a lower side outlet(43d). The sorting plate has a hemi spherical shape along the hemi spherical trace movement of the sorter unit. The pose change of a upper end link part(45) induces the trace movement of the lower side follower connected to a lower end link part(48) specifically by restricting the movement of the lower link part using the upper part link part. |
