发明名称 Capacitance measurement circuit and method
摘要 A capacitance measurement circuit and method are provided. A storage capacitor is pre-charged. Charge transfer is performed between an under-test capacitor and the storage capacitor. The storage capacitor is discharged and charged according to a relationship between a voltage of the storage capacitor and a reference voltage. The capacitance of the under-test capacitor is measured according to the voltage on the storage capacitor.
申请公布号 US8415957(B2) 申请公布日期 2013.04.09
申请号 US20090639484 申请日期 2009.12.16
申请人 HUANG HE-WEI;CHANG CHIH-YUAN;CHANG HUI-HUNG;NOVATEK MICROELECTRONICS CORP. 发明人 HUANG HE-WEI;CHANG CHIH-YUAN;CHANG HUI-HUNG
分类号 G01R27/26 主分类号 G01R27/26
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