发明名称 |
Capacitance measurement circuit and method |
摘要 |
A capacitance measurement circuit and method are provided. A storage capacitor is pre-charged. Charge transfer is performed between an under-test capacitor and the storage capacitor. The storage capacitor is discharged and charged according to a relationship between a voltage of the storage capacitor and a reference voltage. The capacitance of the under-test capacitor is measured according to the voltage on the storage capacitor. |
申请公布号 |
US8415957(B2) |
申请公布日期 |
2013.04.09 |
申请号 |
US20090639484 |
申请日期 |
2009.12.16 |
申请人 |
HUANG HE-WEI;CHANG CHIH-YUAN;CHANG HUI-HUNG;NOVATEK MICROELECTRONICS CORP. |
发明人 |
HUANG HE-WEI;CHANG CHIH-YUAN;CHANG HUI-HUNG |
分类号 |
G01R27/26 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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