发明名称 Semiconductor device having thermal endurance and method of manufacturing the same
摘要 There is provided a semiconductor device including: a circuit board formed by bonding a first and a second metal plates to both surfaces of an insulating substrate respectively, at least one semiconductor element to be bonded to an external surface of the first metal plate through a first solder, and a radiating base plate to be bonded to an external surface of the second metal plate through a second solder, wherein the first and the second solders are constituted by solder materials of the same type, and a ratio of a sum of thicknesses of the first and the second metal plates to a thickness of the insulating substrate is set in a predetermined range to ensure an endurance to a temperature stress of each of the first and the second solders.
申请公布号 US8415801(B2) 申请公布日期 2013.04.09
申请号 US20100794012 申请日期 2010.06.04
申请人 OGURA MASAMI;TAKAYANAGI TAKAHITO;YAMADA YUKO;KATO JUN;MASUDA TSUGIO;AIBA TSUKASA;TAKANO FUMITOMO;HONDA MOTOR CO., LTD. 发明人 OGURA MASAMI;TAKAYANAGI TAKAHITO;YAMADA YUKO;KATO JUN;MASUDA TSUGIO;AIBA TSUKASA;TAKANO FUMITOMO
分类号 H01L23/488 主分类号 H01L23/488
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