发明名称 APPARATUS AND METHOD FOR TESTING LED
摘要 PURPOSE: A light emitting diode inspection apparatus and a method are provided to offer the light emitting diode inspection apparatus and the method in a short time by confirming the adhesive force between materials used in manufacturing the light emitting diode package by adding a vacuum shock in the light emitting diode and whether or not the light emitting diode package is transforming. CONSTITUTION: A light emitting diode inspection apparatus(100) comprises an input unit(110) detecting the light emitting diode inspection vacuum pressure set up information of the light emitting diode, the vacuum maintenance time information and the inspection information including the selection information confirming the storage of an image signal, a control unit(120) outputting the light emitting diode inspection vacuum pressure control signal and the inspection time control signal depending on the inspection information detected from the input unit, a vacuum pump(130) which is operated to generate the vacuum pressure by the vacuum pressure control signal outputted from the control unit, and a chamber(140) in which the inspection light emitting diode is accepted inside, generates the vacuum presser or releasing the generated vacuum pressure by the operation of the vacuum pump. [Reference numerals] (110) Input unit; (120) Control unit; (121) Vacuum pressure control unit; (122) Reactant control unit; (130) Vacuum pump; (140a) First chamber; (140b) Second chamber; (150) Reactant supply unit;
申请公布号 KR20130034708(A) 申请公布日期 2013.04.08
申请号 KR20110098720 申请日期 2011.09.29
申请人 KOREA PHOTONICS TECHNOLOGY INSTITUTE 发明人 KIM, JAE PIL;SONG, SANG BIN;KIM, WAN HO;PARK, JOUNG WOOK;OG, MI YEUN;JANG, MIN SUK
分类号 G01R31/26;H01L21/02;H01L21/66 主分类号 G01R31/26
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