发明名称 METHOD OF INSPECTING A SUBSTRATE
摘要 PURPOSE: A substrate inspecting method is provided to input and save a coordinate value and fault code value through a computerization process, thereby accurately and rapidly performing an inspection process. CONSTITUTION: A substrate inspecting method comprises next steps. A coordinate value indicating a position of a pseudo fault detected by an automatic optical inspecting device is saved in a database by using a programmed primary procedure function(S104). A fault coordinate value corresponding to the true fault is saved in the database by suing the programmed secondary procedure function(S203). [Reference numerals] (AA) Start; (BB) Finish; (S101) Coordinate value input; (S102) Coordinate value extraction; (S103) Existing on a primary saving table?; (S104, S203) Addition; (S105) Coordinate value corresponding to the last decision failure?; (S106, S204) Renewal; (S201) Failure code value input; (S202) Existing on a secondary saving table?
申请公布号 KR101251737(B1) 申请公布日期 2013.04.05
申请号 KR20110032780 申请日期 2011.04.08
申请人 发明人
分类号 G01B11/03;G01N21/88;H01L21/66;H05K13/08 主分类号 G01B11/03
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