发明名称 METHOD OF APPLYING A PATTERN TO A SUBSTRATE, DEVICE MANUFACTURING METHOD AND LITHOGRAPHIC APPARATUS FOR USE IN SUCH METHODS
摘要 <p>PURPOSE: A method for applying a pattern to a substrate, a method for manufacturing a device, and a lithography apparatus used for the same are provided to improve the accuracy of a patterning position by correcting high order distortions of a nominal alignment grid based on the measured positions of alignment marks. CONSTITUTION: A lighting system(IL) conditions radiation beams(B) and includes various optical elements to form or control the radiation beams. A support structure(MT) supports a patterning device(MA). A substrate table(WTa,WTb) maintains a substrate(W). The substrate table is connected to a second position setting unit(PW) to accurately position the substrate according to preset parameters. A projection system(PS) projects a pattern of the radiation beam on a target of the substrate.</p>
申请公布号 KR20130034631(A) 申请公布日期 2013.04.05
申请号 KR20120108101 申请日期 2012.09.27
申请人 ASML NETHERLANDS B.V. 发明人 VAN DER SANDEN STEFAN CORNELIS THEODORUS;VAN HAREN RICHARD JOHANNES FRANCISCUS;SIMONS HUBERTUS JOHANNES GERTRUDUS;EDART REMI DANIEL MARIE;WEI XIUHONG;KUBIS MICHAEL;LYULINA IRINA
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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