发明名称 |
METHOD OF APPLYING A PATTERN TO A SUBSTRATE, DEVICE MANUFACTURING METHOD AND LITHOGRAPHIC APPARATUS FOR USE IN SUCH METHODS |
摘要 |
<p>PURPOSE: A method for applying a pattern to a substrate, a method for manufacturing a device, and a lithography apparatus used for the same are provided to improve the accuracy of a patterning position by correcting high order distortions of a nominal alignment grid based on the measured positions of alignment marks. CONSTITUTION: A lighting system(IL) conditions radiation beams(B) and includes various optical elements to form or control the radiation beams. A support structure(MT) supports a patterning device(MA). A substrate table(WTa,WTb) maintains a substrate(W). The substrate table is connected to a second position setting unit(PW) to accurately position the substrate according to preset parameters. A projection system(PS) projects a pattern of the radiation beam on a target of the substrate.</p> |
申请公布号 |
KR20130034631(A) |
申请公布日期 |
2013.04.05 |
申请号 |
KR20120108101 |
申请日期 |
2012.09.27 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
VAN DER SANDEN STEFAN CORNELIS THEODORUS;VAN HAREN RICHARD JOHANNES FRANCISCUS;SIMONS HUBERTUS JOHANNES GERTRUDUS;EDART REMI DANIEL MARIE;WEI XIUHONG;KUBIS MICHAEL;LYULINA IRINA |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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