| 摘要 |
PURPOSE: An infrared detection device and a poor cell detection method are provided to form a self test cell around a cell array including an infrared lead-out cell and to detect failure by performing a cell test before mounting an infrared ray detector, thereby reducing time and costs for detecting failure. CONSTITUTION: An infrared detection device comprises a substrate(40), a plurality of row lines(120), a plurality of column lines(130), a plurality of infrared lead-out cells(100), a low decoder(10), an integrating unit(30), a column decoder(20), a self test cell(200), and a controlling unit(170). The low lines are formed on the substrate in a horizontal direction. The column lines are formed in the substrate in a vertical direction. The infrared lead-out cells are connected to the low lines and column lines and formed in a first domain. The low decoder is connected to the low line, thereby providing low address signals. The integrating unit is connected to the column line, thereby integrating a value being output by the plurality of infrared lead-out cells. The column decoder amplifies a value being output by the integrating unit, thereby outputting the value. The self test cell is connected to the low line and formed in a second domain contiguous to the first domain. The controlling unit provides self test signals to the low decoder and column decoder. |
