发明名称 LINEWIDTH MEASUREMENT SYSTEM
摘要 <p>A method includes passing an interrogating light beam through a Fourier transform lens and onto the surface of a material to form a Fraunhofer diffraction pattern of one or more surface features of the material. An image of the diffraction pattern is processed to determine the dimensions of the feature.</p>
申请公布号 WO2013048744(A1) 申请公布日期 2013.04.04
申请号 WO2012US55003 申请日期 2012.09.13
申请人 3M INNOVATIVE PROPERTIES COMPANY;QIAO, YI;DOLEZAL, MICHAEL, W.;HOFELDT, DAVID, L.;LAI, JACK, W.;TARNOWSKI, CATHERINE, P. 发明人 QIAO, YI;DOLEZAL, MICHAEL, W.;HOFELDT, DAVID, L.;LAI, JACK, W.;TARNOWSKI, CATHERINE, P.
分类号 G01N21/89;G01B11/25 主分类号 G01N21/89
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