发明名称 SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCTION THEREOF
摘要 A semiconductor device according to the present invention includes a contact region 201 of a second conductivity type which is provided in a body region 104. The contact region 201 includes a first region 201a in contact with a first ohmic electrode 122 and a second region 201b located at a position deeper than that of the first region 201a and in contact with the body region 104. The first region 201a and the second region 201b each have at least one peak of impurity concentration. The peak of impurity concentration in the first region 201a has a higher value than that of the peak of impurity concentration in the second region 201b.
申请公布号 US2013082285(A1) 申请公布日期 2013.04.04
申请号 US201113701016 申请日期 2011.08.29
申请人 KUDOU CHIAKI;NIWAYAMA MASAHIKO;IKEGAMI RYO;PANASONIC CORPORATION 发明人 KUDOU CHIAKI;NIWAYAMA MASAHIKO;IKEGAMI RYO
分类号 H01L29/16 主分类号 H01L29/16
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