发明名称 SWITCHING MATRIX AND TESTING SYSTEM FOR SEMICONDUCTOR CHARACTERISTIC MEASUREMENT USING THE SAME
摘要 A switching matrix includes a plurality of input ports, a plurality of output ports, a plurality of switching devices configured to open and close, an electrical connection between the input ports and the output ports, and an electrical sensor configured to generate a signal by measuring a predetermined electrical property of the electrical connection, the open and close of switching devices is pre-determined by status read from the electrical sensor.
申请公布号 US2013082731(A1) 申请公布日期 2013.04.04
申请号 US201213425987 申请日期 2012.03.21
申请人 LOU CHOON LEONG;WANG LI MIN;STAR TECHNOLOGIES INC. 发明人 LOU CHOON LEONG;WANG LI MIN
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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