发明名称 SELF-CONTAINED, PATH-LEVEL AGING MONITOR APPARATUS AND METHOD
摘要 <p>An aging monitor circuit that provides a more accurate estimate of aging and/or delay in a circuit and/or circuit path. The aging monitor circuit employs a separate aging path with driving and receiving flip flops (FFs) and a tunable replica circuit (TRC) to enable measurements of single-transition DC-stressed path delay that only propagates through stressed transistors or other circuit element(s). A finite state machine (FSM) in the aging monitor circuit is configured to adjust a frequency of a clock signal output by a digitally controlled oscillator (DCO) in response to an error signal output by the receiving FF. The error signal is generated in response to single transition DC-stressed path delay, and therefore enables the adjustment of the frequency of the clock signal to correspond to an amount or effect of the delay.</p>
申请公布号 WO2013048398(A1) 申请公布日期 2013.04.04
申请号 WO2011US53790 申请日期 2011.09.28
申请人 INTEL CORPORATION;BOWMAN, KEITH, A.;TOKUNAGA, CARLOS;TSCHANZ, JAMES, W. 发明人 BOWMAN, KEITH, A.;TOKUNAGA, CARLOS;TSCHANZ, JAMES, W.
分类号 H03K5/19;G06F1/04;H03K5/13 主分类号 H03K5/19
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