发明名称 Decapsulator with Applied Voltage for Etching Plastic-Encapsulated Devices
摘要 An apparatus and a method for selectively etching an encapsulant forming a package of resinous material around an electronic device includes an electronic device package mountable on the etch head; a conductive electrode in electrical contact with package leads of the electronic device package to apply a first voltage to the package leads of the electronic device; a first pump configured to pump a first quantity of the etchant solution from the source into the etch head where the etchant solution is electrically biased to a second voltage different from the first voltage. An etch cavity is formed on an exterior surface of the electronic device package. When the etchant solution has etched through an exterior surface of the electronic device package, the conductive bond wires of the electronic device is prevented from being etched by the applied first voltage.
申请公布号 US2013082031(A1) 申请公布日期 2013.04.04
申请号 US201213619489 申请日期 2012.09.14
申请人 WAGNER ALAN M.;NISENE TECHNOLOGY GROUP 发明人 WAGNER ALAN M.
分类号 C23F1/08;B44C1/22 主分类号 C23F1/08
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