发明名称 MARKING SIGNAL CONTROL METHOD IN PRINTED MATTER DEFECT INSPECTION
摘要 <P>PROBLEM TO BE SOLVED: To provide a marking signal control method in printed matter defect inspection, capable of performing marking at a defect position with positioning accuracy in consideration of the operation delay of a marking device and a printed matter conveyance speed. <P>SOLUTION: A marking signal control method in printed matter defect inspection is the method for allowing a marking device to perform marking at a defect position when a defect is detected after the inspection of a printed matter where printing is performed on a base material, including: obtaining a printed matter conveyance amount within the operation delay time of the marking device from the acquisition of a marking signal to the performance of the marking on the basis of the operation delay time of the marking device and a printed matter conveyance speed; obtaining a delay amount for original delay by subtracting the printed matter conveyance amount within the operation delay time of the marking device from a unique delay amount indicating a distance from a predetermined inspection position to the marking device; and operating the marking device on the basis of the delay amount for original delay. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013061313(A) 申请公布日期 2013.04.04
申请号 JP20110201699 申请日期 2011.09.15
申请人 TOPPAN PRINTING CO LTD 发明人 CHOI HAE YONG
分类号 G01N21/892 主分类号 G01N21/892
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