| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a current path test device capable of checking current paths for normal connection, reverse connection, short circuits, disconnection, and short circuits among a plurality of current paths. <P>SOLUTION: For example the following detection is made possible. A connection part of a capacitive element 1 and a capacitive element 2 is let to be one end of the capacitive element 2. When an electric current flows to an outside current path through the one end of the capacitive element 2, the other end of the capacitive element 2, and a rectifier element, the one end of the capacitive element 2 is positively charged and the other end thereof is negatively charged; the electric potential at the one end of the capacitive element 2 is applied to one end of the current path of a semiconductor element; the electric potential at the other end of the capacitive element 2 is applied to a control end of the semiconductor element; and the control end of the semiconductor element is biased forward so that the current path of the semiconductor element becomes conductive to allow a current to flow through a light emitter, which causes the light emitter to emit light, detecting that the outside current path is reversely connected. <P>COPYRIGHT: (C)2013,JPO&INPIT |
