发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 <p>Provided are a semiconductor structure and a manufacturing method thereof. The method comprises: providing a semiconductor substrate (100), forming an insulation layer (101) on the semiconductor substrate (100), and forming a semiconductor base on the insulation layer (101); forming a sacrificial layer and a side wall surrounding the sacrificial layer on the semiconductor base, and etching the semiconductor base by using the side wall as a mask to form a semiconductor base body; forming a dielectric film (300) on a side wall of the semiconductor base body; removing the sacrificial layer and the semiconductor base body located under the sacrificial layer, and forming a first semiconductor fin (210) and a second semiconductor fin (220); and forming an inverted doped well structure on side walls (210-1, 220-1) corresponding to the first semiconductor fin (210) and the second semiconductor fin (220).</p>
申请公布号 WO2013044582(A1) 申请公布日期 2013.04.04
申请号 WO2012CN00650 申请日期 2012.05.14
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG 发明人 YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG
分类号 H01L21/336;H01L21/28;H01L29/423;H01L29/78 主分类号 H01L21/336
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