发明名称 |
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>Provided are a semiconductor structure and a manufacturing method thereof. The method comprises: providing a semiconductor substrate (100), forming an insulation layer (101) on the semiconductor substrate (100), and forming a semiconductor base on the insulation layer (101); forming a sacrificial layer and a side wall surrounding the sacrificial layer on the semiconductor base, and etching the semiconductor base by using the side wall as a mask to form a semiconductor base body; forming a dielectric film (300) on a side wall of the semiconductor base body; removing the sacrificial layer and the semiconductor base body located under the sacrificial layer, and forming a first semiconductor fin (210) and a second semiconductor fin (220); and forming an inverted doped well structure on side walls (210-1, 220-1) corresponding to the first semiconductor fin (210) and the second semiconductor fin (220).</p> |
申请公布号 |
WO2013044582(A1) |
申请公布日期 |
2013.04.04 |
申请号 |
WO2012CN00650 |
申请日期 |
2012.05.14 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
发明人 |
YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
分类号 |
H01L21/336;H01L21/28;H01L29/423;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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