发明名称 METHODS AND APPARATUS FOR TESTING MULTIPLE-IC DEVICES
摘要 Embodiments include systems that include at least one integrated circuit (IC) and methods for their testing. Each IC includes an input interconnect to receive an input signal, a test enable interconnect to receive a test enable signal, and a controller (e.g., a TAP controller) for performing testing of the integrated circuit based on values in at least one register (values corresponding to the input signal). Each IC also includes an input port and a multiplexer coupled to the first input interconnect, the at least one register, and the input port. The multiplexer is controllable to pass the input signal to the input port in response to non-assertion of the test enable signal, and to pass the input signal to the at least one register in response to assertion of the test enable signal. When the system includes multiple controllers, each controller may implement a different opcode-to-instruction mapping.
申请公布号 US2013085704(A1) 申请公布日期 2013.04.04
申请号 US201113250368 申请日期 2011.09.30
申请人 STANLEY MICHAEL E.;VACCARO JOSEPH S.;FREESCALE SEMICONDUCTOR, INC. 发明人 STANLEY MICHAEL E.;VACCARO JOSEPH S.
分类号 G06F19/00 主分类号 G06F19/00
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