发明名称 CURRENT PROBE, CURRENT PROBE MEASUREMENT SYSTEM, AND CURRENT PROBE MEASUREMENT METHOD
摘要 <p>Provided is a current probe which reduces, in current measurement, a measurement error due to an unnecessary magnetic field generated from a subject not to be measured, said subject being adjacent to a subject to be measured. The current probe is characterized in having: a sensor that detects a magnetic field; a transmission path connected to the sensor; and a pair of conductive members, which protrude toward the front from a leading edge portion of the sensor, and are provided to face the sensor. The current probe is also characterized in that a front portion of the sensor, said portion being surrounded by the protruding portions of the conductive members, is opened in the direction of a plane that faces the conductive members.</p>
申请公布号 WO2013046881(A1) 申请公布日期 2013.04.04
申请号 WO2012JP68406 申请日期 2012.07.20
申请人 HITACHI, LTD.;FUNATO, HIROKI;SUGA, TAKASHI 发明人 FUNATO, HIROKI;SUGA, TAKASHI
分类号 G01R15/14;G01R19/00;G01R29/08 主分类号 G01R15/14
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