发明名称 SPECTRUM ANALYZER, MICROPARTICLE MEASURING DEVICE, AND METHOD AND PROGRAM FOR ANALYZING SPECTRA OR DISPLAYING SPECTRAL CHARTS
摘要 <P>PROBLEM TO BE SOLVED: To provide a technique for obtaining a spectral chart capable of displaying a wide dynamic range and negative numbers and properly reflecting intensity of light generated from microparticles. <P>SOLUTION: A spectrum analyzer is provided with a processor which generates analysis data from measured data, including intensity values of light from a measuring object detected and acquired by a plurality of photosensors having different detection wavelength ranges, using an analytical function that includes linear and logarithmic functions as function elements and uses the light intensity value as a variable. The spectrum analyzer presents the analysis data in the form of a spectral chart with one axis representing a value corresponding to the detection wavelength region and the other axis representing the output value of the analytical function, thereby displaying a wide dynamic range including negative values and suppressing dispersion to display a spectrum that properly represents optical properties of the measuring object. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013061246(A) 申请公布日期 2013.04.04
申请号 JP20110199901 申请日期 2011.09.13
申请人 SONY CORP 发明人 NITTA TAKASHI
分类号 G01N21/64;G01N15/14;G01N21/27 主分类号 G01N21/64
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