发明名称 |
SCANNING ELECTRON MICROSCOPE EQUIPPED WITH BACK SCATTERED ELECTRON DETECTION FUNCTION |
摘要 |
<p>The present invention relates to a scanning electron microscope equipped with a back scattered electron detection function, which causes primary electrons generated from a light source to enter a specimen, and after the primary electrons have entered therein, detects emitted electrons which are emitted from the specimen. The scanning electron microscope equipped with a back scattered electron detection function is characterised by comprising: a Wien filter unit, which is arranged between the light source and the specimen, and which separates the emitted electrons into secondary electrons and back scattered electrons by generating a magnetic field and an electric field; and a detecting unit which detects the secondary electrons and back scattered electrons separated by the Wien filter unit. Thus, provided is a scanning electron microscope equipped with a back scattered electron detection function which enables the separation and detection of secondary electrons and back-scattered electrons due to the use of a Wien filter.</p> |
申请公布号 |
WO2013047919(A1) |
申请公布日期 |
2013.04.04 |
申请号 |
WO2011KR07128 |
申请日期 |
2011.09.28 |
申请人 |
SNU PRECISION CO., LTD.;KIM, SOUK;AHN, JAE HYUNG;KIM, JAE HO |
发明人 |
KIM, SOUK;AHN, JAE HYUNG;KIM, JAE HO |
分类号 |
H01J37/28;H01J37/244 |
主分类号 |
H01J37/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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