发明名称 FILM-TYPE PROBE BLOCK FOR CHECKING LCD
摘要 PURPOSE: An LCD testing film type probe block for easy alignment is provided to provide elasticity at the time of contact by pressurizing a film type probe contactor using a tension block, easily perform alignment by the adjustment of the tension block to X, Y and Z directions on a block body, prevent the displacement of the film type probe contactor by elasticity and pressure despite consistent pressurization by forming an inclined surface on the lower surface of the tension block and increasing the pressurization during the time of pressurizing the film type probe contactor, and simultaneously making the input part of a film and an electrode pad exactly connected, thereby increasing the test efficiency. CONSTITUTION: An LCD testing film type probe block includes a block body(10), a tension block(20), guide block(30), a stick bar(40), a probe contactor(50), an FPC(60) and a cover plate(70). The block body having a flat plate shape vertically forms an extension part in the front, an inserting groove on the lower surface of the extension part and an alignment control hole on the upper surface and the side of the extension part. The tension block includes a lower plate having a flat plate shape made of a synthetic resin material and includes a combining protrusion vertically protruded on an upper surface side of the lower plate as an integral part in order to be inserted into the insertion groove of the block body. The tension block is combined to the block body using bolts. The guide block of which a side has a triangular shape is combined to the bottom of the block body. The stick bar is attached and fixed to the bottom plate of the tension block. The probe contactor having a film type including a drive IC(Integrated Circuit) is attached and fixed to the lower surface of the stick bar. The input terminal and the output terminal of the probe contactor are interconnected at the FPC. The cover plate combined to the lower surface of the guide block using bolts fixes the probe contactor and the FPC to the guide block by pressure.
申请公布号 KR101249467(B1) 申请公布日期 2013.04.03
申请号 KR20130001067 申请日期 2013.01.04
申请人 UBPRECISION CO., LTD. 发明人 KANG, CHUL;SEO, KWANG IK;KWON, HYUN SOO;BYUN, GUN DAE;BACK, SEUNG GEUN
分类号 G01R1/073;G01R1/067;G02F1/13 主分类号 G01R1/073
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