发明名称 |
Method and device for determining the temperature of a semiconductor switch |
摘要 |
<p>The method involves switching-on a semiconductor switch (1) by increasing gate emitter voltage (Uge) of the switch, where a gate resistor terminal (GA) of the switch is connected to an external electrical resistor (Rext) via a resistor. Time duration (dt) required for increasing the gate emitter voltage of the switch from a voltage (U1) to another voltage (U2). Temperature (T) of the switch is determined based on the determined time duration. The switch is switched-off when the detected temperature reaches or exceeds a temperature threshold value (Tk). An independent claim is also included for a device for determining temperature of a semiconductor switch.</p> |
申请公布号 |
EP2575255(A1) |
申请公布日期 |
2013.04.03 |
申请号 |
EP20120182959 |
申请日期 |
2012.09.04 |
申请人 |
SEMIKRON ELEKTRONIK GMBH & CO. KG |
发明人 |
SCHULER, STEFAN |
分类号 |
H03K17/0812;G01K7/01;G01K7/34;H03K17/08 |
主分类号 |
H03K17/0812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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