发明名称 Method for fabricating resistive memory device
摘要 A method for fabricating a resistive memory device includes forming a lower electrode including a metal nitride layer over a substrate, forming a metal oxide layer used as a variable resistance material by oxidizing a part of the metal nitride layer, and forming an upper electrode on the metal oxide layer.
申请公布号 US8409914(B2) 申请公布日期 2013.04.02
申请号 US20090486811 申请日期 2009.06.18
申请人 SUNG MIN-GYU;HYNIX SEMICONDUCTOR INC. 发明人 SUNG MIN-GYU
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
主权项
地址