发明名称 |
Impulse immunity test apparatus |
摘要 |
The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform. A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time. |
申请公布号 |
US8410791(B2) |
申请公布日期 |
2013.04.02 |
申请号 |
US20080530168 |
申请日期 |
2008.03.06 |
申请人 |
TSUKAGOSHI TSUNEO;WATANABE TAKESHI;NAKAIE TOSHIYUKI;MATSUI NOBUCHIKA;NEC CORPORATION;RENESAS ELECTRONICS CORPORATION;HANWA ELECTRONIC IND. CO., LTD. |
发明人 |
TSUKAGOSHI TSUNEO;WATANABE TAKESHI;NAKAIE TOSHIYUKI;MATSUI NOBUCHIKA |
分类号 |
G01R27/28;G01R27/26 |
主分类号 |
G01R27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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