发明名称 |
Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector |
摘要 |
The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector. |
申请公布号 |
US8410415(B2) |
申请公布日期 |
2013.04.02 |
申请号 |
US201113279081 |
申请日期 |
2011.10.21 |
申请人 |
NAKAMURA MEGUMI;SHIOKAWA YOSHIRO;PENG QIANG;CANON ANELVA CORPORATION |
发明人 |
NAKAMURA MEGUMI;SHIOKAWA YOSHIRO;PENG QIANG |
分类号 |
H01J43/06;H01J40/06;H01J43/10 |
主分类号 |
H01J43/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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