发明名称 Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector
摘要 The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector.
申请公布号 US8410415(B2) 申请公布日期 2013.04.02
申请号 US201113279081 申请日期 2011.10.21
申请人 NAKAMURA MEGUMI;SHIOKAWA YOSHIRO;PENG QIANG;CANON ANELVA CORPORATION 发明人 NAKAMURA MEGUMI;SHIOKAWA YOSHIRO;PENG QIANG
分类号 H01J43/06;H01J40/06;H01J43/10 主分类号 H01J43/06
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