发明名称 Seek and scan probe (SSP) cantilever stop structures
摘要 MEMS storage devices and associated systems and structures are generally described. In one example, a micro-electro-mechanical (MEMS) storage device includes a substrate, a lateral actuation structure coupled with the substrate, a micro-electro-mechanical (MEMS) probe coupled with the lateral actuation structure, the MEMS probe having a first end, a second end having a probe tip, and a longitudinal axis extending between the first end and the second end, wherein the second end can be actuated in a direction substantially normal to a surface of the substrate, and one or more stop beam structures coupled with the lateral actuation structure to restrict motion of the MEMS probe in the direction substantially normal to the surface of the substrate.
申请公布号 US8411550(B2) 申请公布日期 2013.04.02
申请号 US20080258878 申请日期 2008.10.27
申请人 CHOU TSUNG-KUAN ALLEN;HARRAR, II DAVID;INTEL CORPORATION 发明人 CHOU TSUNG-KUAN ALLEN;HARRAR, II DAVID
分类号 G11B7/00 主分类号 G11B7/00
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