发明名称 On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
摘要 A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface wave assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
申请公布号 US8411282(B2) 申请公布日期 2013.04.02
申请号 US201113157245 申请日期 2011.06.09
申请人 CUI XIQUAN;YANG CHANGHUEI;SCHERER AXEL;PSALTIS DEMETRI;HENG XIN;CALIFORNIA INSTITUTE OF TECHNOLOGY 发明人 CUI XIQUAN;YANG CHANGHUEI;SCHERER AXEL;PSALTIS DEMETRI;HENG XIN
分类号 G01B9/02 主分类号 G01B9/02
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