发明名称 Solid-state imaging device and image defect correction processing circuit
摘要 According to one embodiment, an image defect correction processing circuit includes a signal level comparator circuit and a defect correction circuit. The signal level comparator circuit extracts the maximum signal level and the minimum signal level from a plurality of pixel signals existing around a correction target pixel. The defect correction circuit executes defect corrections with respect to the correction target pixel.
申请公布号 US8411175(B2) 申请公布日期 2013.04.02
申请号 US20100823646 申请日期 2010.06.25
申请人 SATO RYUKI;HOSOKAWA JUNICHI;KABUSHIKI KAISHA TOSHIBA 发明人 SATO RYUKI;HOSOKAWA JUNICHI
分类号 H04N5/217 主分类号 H04N5/217
代理机构 代理人
主权项
地址