发明名称 |
Solid-state imaging device and image defect correction processing circuit |
摘要 |
According to one embodiment, an image defect correction processing circuit includes a signal level comparator circuit and a defect correction circuit. The signal level comparator circuit extracts the maximum signal level and the minimum signal level from a plurality of pixel signals existing around a correction target pixel. The defect correction circuit executes defect corrections with respect to the correction target pixel. |
申请公布号 |
US8411175(B2) |
申请公布日期 |
2013.04.02 |
申请号 |
US20100823646 |
申请日期 |
2010.06.25 |
申请人 |
SATO RYUKI;HOSOKAWA JUNICHI;KABUSHIKI KAISHA TOSHIBA |
发明人 |
SATO RYUKI;HOSOKAWA JUNICHI |
分类号 |
H04N5/217 |
主分类号 |
H04N5/217 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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