发明名称 Microelectronic assembly with joined bond elements having lowered inductance
摘要 A microelectronic assembly includes a semiconductor chip having chip contacts exposed at a first face and a substrate juxtaposed with a face of the chip. A conductive bond element can electrically connect a first chip contact with a first substrate contact of the substrate, and a second conductive bond element can electrically connect the first chip contact with a second substrate contact. The first bond element can have a first end metallurgically joined to the first chip contact and a second end metallurgically joined to the first substrate contact. A first end of the second bond element can be metallurgically joined to the first bond element. The second bond element may or may not touch the first chip contact or the substrate contact. A third bond element can be joined to ends of first and second bond elements which are joined to substrate contacts or to chip contacts. In one embodiment, a bond element can have a looped connection, having first and second ends joined at a first contact and a middle portion joined to a second contact.
申请公布号 US8410618(B2) 申请公布日期 2013.04.02
申请号 US201113196192 申请日期 2011.08.02
申请人 HABA BELGACEM;DAMBERG PHILIP;OSBORN PHILIP R.;TESSERA, INC. 发明人 HABA BELGACEM;DAMBERG PHILIP;OSBORN PHILIP R.
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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