发明名称 OPTICAL DEVICE INSPECTION TOOL AND OPTICAL DEVICE INSPECTION METHOD
摘要 <p>When the optical device inspection tool is closed by superimposing the cover on the tool body, a storage area for storing optical lenses is formed therein. When the cover is opened from the tool body, of the side edges forming the lower tool body surface that faces the surface on which the tool is placed, the side edge in the direction of the opening-closing axis on the side of the connection to the cover forms a first beveled surface, and of the side edges forming the lower cover surface that faces the surface on which the tool is placed, the side edge in the direction of the opening-closing axis on the side of the connection to the tool body forms a second beveled surface. By allowing the first and second beveled surfaces to contact the surface on which the tool is placed when the cover is open, the respective lower surfaces of the tool body and the cover are inclined with respect to the surface on which the tool is placed and the open state is maintained.</p>
申请公布号 WO2013042585(A1) 申请公布日期 2013.03.28
申请号 WO2012JP73251 申请日期 2012.09.12
申请人 KONICA MINOLTA ADVANCED LAYERS, INC.;ITOH, TERUHIKO 发明人 ITOH, TERUHIKO
分类号 G01M11/00 主分类号 G01M11/00
代理机构 代理人
主权项
地址