发明名称 METHOD FOR OPTIMIZING OBSERVED IMAGE CLASSIFICATION CRITERION AND IMAGE CLASSIFICATION APPARATUS
摘要 A first object is to use both ADC (automatic defect classification) and MDC (manual defect classification) and reduce the amount of MDC operation. A second object is to prevent a DOI (defect of interest) from being missed. The first object is achieved by displaying judgment information on a screen. The judgment information is necessary when part of the classification is performed by ADC and part of the classification is performed by MDC and used to judge which classification is used, ADC or MDC. In the display operation, ADC classification results and MDC classification results are also displayed in the form of matrix. Further, a missed DOI rate is calculated for each classification threshold used in the defect classification and displayed on the screen.
申请公布号 US2013077850(A1) 申请公布日期 2013.03.28
申请号 US201113702674 申请日期 2011.05.13
申请人 HIRAI TAKEHIRO;MIYAKE KOZO;KONISHI JUNKO 发明人 HIRAI TAKEHIRO;MIYAKE KOZO;KONISHI JUNKO
分类号 G06T7/00 主分类号 G06T7/00
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