发明名称 METHOD FOR MEASUREMENT OF TOPOGRAPHY ON THE SURFACE OF A MATERIAL WEB
摘要 <p>Procedure used for, in essential real time, measuring the topography of the surface of a material web (3) which is in motion, by illuminating the surface with a Cross machine Directional, or essentially Cross machine Directional line of optically radiated light that is emitted from at least one optical radiating light source (4) where the reflected light from the illuminated surface (2) of the web (3) is gathered (registred) by at least one image sensor or sensors (5), whereafter the, by the image sensor or sensors, gathered information is compiled and processed by at least one processing device (6) into topographical information regarding the surface of the web, and whereafter the topographical information is stored on a storage device and/or is transmitted to at least one other unit. The uniqueness of the invention described in this patent application is that at least one image sensor (5) gathers information that is transformed into a very wide spatial wavelength spectrum, and that the measurement is done in the Cross machine Direction, or essential Cross machine Direction, of the web (3), and that the measurement occurs when to movement velocity of the web is at least 10 meters per minute.</p>
申请公布号 WO2013043103(A1) 申请公布日期 2013.03.28
申请号 WO2012SE00145 申请日期 2012.09.24
申请人 LUNDGREN, THIM, JAN, PETER;O'NILS, MATTIAS;MANUILSKIY, ANATOLLY;ALAM, ANZAR, MOHAMMAD 发明人 LUNDGREN, THIM, JAN, PETER;O'NILS, MATTIAS;MANUILSKIY, ANATOLLY;ALAM, ANZAR, MOHAMMAD
分类号 G01B11/30;G01N21/86;G01N21/89;G01N33/34 主分类号 G01B11/30
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