| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an electrostatic latent image measurement method for controlling a direction of an electric field to be generated by charges on a photoreceptor sample, and improving a difference in detection condition of secondary electrons which is generated in a measurement region to improve measurement accuracy, thereby improving image quality of a machine (image forming device). <P>SOLUTION: An electron orbit control charging area a2 is formed on the outside of an electrostatic latent image measurement area a1 on the photoreceptor sample. Secondary electrons generated from the photoreceptor sample by irradiation of an electron beam move upward by influence of an electric field generated by charges. The secondary electrons move in a direction away from the charging center in an X direction (lateral direction in Fig.) by influence of the electric field, as well. When the electron orbit control charging area is formed on the outside of the measurement area, an electric field distribution generated by the charges moderately changes in position in the sample, as compared with a conventional case. The secondary electrons generated in each position in the sample are likely to collide with a secondary electron trapping member disposed above. <P>COPYRIGHT: (C)2013,JPO&INPIT |
