发明名称 Writing Circuit for a Resistive Memory Cell Arrangement and a Memory Cell Arrangement
摘要 A writing circuit for a resistive memory cell arrangement is provided, the resistive memory cell arrangement including a plurality of resistive memory cells. The writing circuit includes a controlled voltage source including a plurality of pass transistors, wherein each pass transistor includes a first source/drain terminal, a second source/drain terminal and a gate terminal, and wherein the first source/drain terminal is configured to be electrically coupled to a power supply line and the second source/drain terminal is configured to be electrically coupled to a bit line associated with a resistive memory cell of the plurality of resistive memory cells, and a plurality of switches, wherein each switch is configured to control the gate terminal of the pass transistor, wherein the controlled voltage source is configured to supply a voltage to the resistive memory cell for a write operation. Further embodiments provide a resistive memory cell arrangement.
申请公布号 US2013077383(A1) 申请公布日期 2013.03.28
申请号 US201213623451 申请日期 2012.09.20
申请人 AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH;AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH 发明人 HUANG KEJIE;ZHAO RONG
分类号 G11C7/00 主分类号 G11C7/00
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