发明名称 THIN FILM, PATTERN LAYER AND MANUFACTURING METHOD THEREOF
摘要 <p>The present invention provides a pattern layer and a manufacturing method thereof. The manufacturing method of the pattern layer comprises: coating a substrate with a film and controlling a coating parameter to change with time, to form a thin film with a film substance changing with the thickness of the coated film on the substrate; etching the thin film so that a lateral etching rate of the thin film changes with the film substance, to form a pattern layer having a side surface with a predetermined curvature. The present invention further provides a thin film. By means of the foregoing method, the lateral etching rate of the thin film can be controlled through the change of the film substance.</p>
申请公布号 WO2013040821(A1) 申请公布日期 2013.03.28
申请号 WO2011CN80939 申请日期 2011.10.18
申请人 SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.;CHENG, WENDA 发明人 CHENG, WENDA
分类号 H01L21/20;H01L21/768;H01L23/50 主分类号 H01L21/20
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