发明名称 |
THIN FILM, PATTERN LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>The present invention provides a pattern layer and a manufacturing method thereof. The manufacturing method of the pattern layer comprises: coating a substrate with a film and controlling a coating parameter to change with time, to form a thin film with a film substance changing with the thickness of the coated film on the substrate; etching the thin film so that a lateral etching rate of the thin film changes with the film substance, to form a pattern layer having a side surface with a predetermined curvature. The present invention further provides a thin film. By means of the foregoing method, the lateral etching rate of the thin film can be controlled through the change of the film substance.</p> |
申请公布号 |
WO2013040821(A1) |
申请公布日期 |
2013.03.28 |
申请号 |
WO2011CN80939 |
申请日期 |
2011.10.18 |
申请人 |
SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.;CHENG, WENDA |
发明人 |
CHENG, WENDA |
分类号 |
H01L21/20;H01L21/768;H01L23/50 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|