TEST PIN AND TEST SOCKET FOR EXTREMELY FINE PITCH AND HIGH PERFORMANCE

摘要

PURPOSE: A highly integrated high performance test pin and a socket for inspection are provided to secure sufficient movement distance of a probe despite its small size. CONSTITUTION: A test pin includes an upper probe(120), a plate spring unit(160) and a lower p robe(130). The upper probe, the plate spring unit and the lower probe are an integrated type. The plate spring unit applies an elastic force to the upper probe and the lower probe. The plate spring unit includes an elastic unit(161,163) and a spacer(162).