发明名称 |
STORAGE DEVICE TESTING SYSTEMS |
摘要 |
A storage device test system includes a test slot configured to receive at least two storage devices for testing, the at least two storage devices being in a same plane. |
申请公布号 |
WO2013043786(A2) |
申请公布日期 |
2013.03.28 |
申请号 |
WO2012US56203 |
申请日期 |
2012.09.20 |
申请人 |
TERADYNE, INC. |
发明人 |
MERROW, BRIAN S.;TOSCANO, JOHN P.;DUTREMBLE, TOM;TRUEBENBACH, ERIC L. |
分类号 |
G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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