发明名称 CHEMICAL MECHANICAL POLISHING SLURRY
摘要 <p>The present invention relates to a chemical mechanical polishing slurry which includes abrasive particles, oxidants, amino acids, quaternary ammonium bases and water, and the pH of the chemical mechanical polishing slurry is alkaline. The slurry could accelerate the polishing rate of copper and silicon at the same time under an alkaline condition.</p>
申请公布号 SG187595(A1) 申请公布日期 2013.03.28
申请号 SG20130005525 申请日期 2011.07.25
申请人 ANJI MICROELECTRONICS (SHANGHAI) CO., LTD 发明人 HE, HUAFENG;WANG, CHEN
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