发明名称 SCANNING ELECTRON MICROSCOPE
摘要 This invention stabilizes positioning and provides improved positioning accuracy in a scanning electron microscope provided with stage-driving means utilizing an effect of rolling friction. In this scanning electron microscope that includes a sample stage equipped with an x-table, a y-table, a z-table, a rotation table, and a tilting table, and moved by means of stepping motors each connected to a ball screw via a coupling, a sliding friction element is disposed at a position close to the ball screw, between the x-table and the y-table and between a tilting base and the x-table.
申请公布号 EP2573795(A1) 申请公布日期 2013.03.27
申请号 EP20110783231 申请日期 2011.05.11
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SAKAMOTO, NAOKI;TAKAHASHI, KANAME;HANEDA, SHIGERU;KAWANISHI, SHINSUKE
分类号 H01J37/20;H01J37/28 主分类号 H01J37/20
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