发明名称 Through-silicon via structure
摘要 A semiconductor substrate has a front surface and a back surface, and a TSV structure is formed to extend through the semiconductor substrate. The TSV structure includes a metal layer, a metal seed layer surrounding the metal layer, a barrier layer surrounding the metal seed layer, and a block layer formed in a portion sandwiched between the metal layer and the metal seed layer. The block layer includes magnesium (Mg), iron (Fe), cobalt (Co), nickel (Ni), titanium (Ti), chromium (Cr), tantalum (Ta), tungsten (W), cadmium (Cd), or combinations thereof.
申请公布号 US8405201(B2) 申请公布日期 2013.03.26
申请号 US20100836720 申请日期 2010.07.15
申请人 LIN YUNG-CHI;WU WENG-JIN;SHUE SHAU-LIN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN YUNG-CHI;WU WENG-JIN;SHUE SHAU-LIN
分类号 H01L23/48 主分类号 H01L23/48
代理机构 代理人
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