发明名称 Nonvolatile semiconductor memory device and writing method thereof
摘要 A control circuit is configured to execute a writing operation for giving a second threshold voltage distribution to a plurality of memory cells formed along one word line. In the writing operation, the control circuit performs a writing operation by executing a voltage applying operation in memory cells to be given the second threshold voltage distribution. While the control circuit executes a voltage applying operation in memory cells to be maintained in an erased state, thereby moving a first threshold voltage distribution to a positive direction to obtain a third threshold voltage distribution representing the erased state.
申请公布号 US8406049(B2) 申请公布日期 2013.03.26
申请号 US201113020401 申请日期 2011.02.03
申请人 NAWATA HIDEFUMI;KABUSHIKI KAISHA TOSHIBA 发明人 NAWATA HIDEFUMI
分类号 G11C11/34;G11C16/04 主分类号 G11C11/34
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