发明名称 Structure and method for manufacturing interconnect structures having self-aligned dielectric caps
摘要 Interconnect structures having self-aligned dielectric caps are provided. At least one metallization level is formed on a substrate. A dielectric cap is selectively deposited on the metallization level.
申请公布号 US8404582(B2) 申请公布日期 2013.03.26
申请号 US20100773306 申请日期 2010.05.04
申请人 HORAK DAVID V;NOGAMI TAKESHI;PONOTH SHOM;YANG CHIH-CHAO;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HORAK DAVID V;NOGAMI TAKESHI;PONOTH SHOM;YANG CHIH-CHAO
分类号 H01L21/4763;H01L23/48 主分类号 H01L21/4763
代理机构 代理人
主权项
地址