发明名称 |
Integrated circuit self-monitored burn-in |
摘要 |
An IC adapted for self-monitored burn-in includes a first memory and at least one BIST circuit coupled to the memory and operative to test the IC by executing a burn-in test and to generate test results indicative of at least one parameter of the burn-in test. The test results are at least temporarily stored in the first memory as a function of a first control signal. |
申请公布号 |
US8405412(B2) |
申请公布日期 |
2013.03.26 |
申请号 |
US20090431053 |
申请日期 |
2009.04.28 |
申请人 |
KOHLER ROSS A.;MCPARTLAND RICHARD J.;WALL LARRY CHRISTOPHER;WERNER WAYNE E.;LSI CORPORATION |
发明人 |
KOHLER ROSS A.;MCPARTLAND RICHARD J.;WALL LARRY CHRISTOPHER;WERNER WAYNE E. |
分类号 |
G01R31/3187;G01R31/00 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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