发明名称 Interconnect structure for integrated circuits
摘要 The present invention discloses an interconnect structure for an integrated circuit formed on a semiconductor substrate. In one embodiment, the first conductive layer is formed above the semiconductor substrate. A first via contact is formed on the first conductive layer. A second via contact is formed on the first via contact. A second conductive layer is formed on the second via contact. One of the first and second via contacts has a cross-sectional area substantially larger that of another for improving a landing margin thereof, thereby eliminating a need of using a landing pad between the first and second via contacts.
申请公布号 US8405216(B2) 申请公布日期 2013.03.26
申请号 US20050170369 申请日期 2005.06.29
申请人 LIAW JHON JHY;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIAW JHON JHY
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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