| 摘要 |
PURPOSE: An ingot inspecting device and an ingot inspection method using the same are provided to photograph an ingot being processed as a semi-finished product shape through a squaring processing by a scanning method with a photographing device, thereby accurately inspecting a size of the ingot with respect to a sectional shape of the ingot. CONSTITUTION: An ingot inspecting device comprises a mount(100), a photographing device, a main beam, and a controller. An ingot is seated on the mount. The photographing device scans a surface outline of the ingot in one side of the mount. The main beam supports the photographing device and drives the same to a three-shaft direction mutually crossed. The controller obtains a size of the ingot by receiving scan images from the photographing device, thereby calculating a central shaft position of the ingot. The controller compares a preset reference size range and a reference central shaft position range, thereby determining an ingot processing state. |
