发明名称 METHOD FOR MAKING STANDARD SAMPLES FOR ADJUSTMENT OF STRUCTURESCOPES
摘要 The invention relates to non-destructive control of constructional materials and can be used in machine-building, aviation, etc. A method for the production of standard samples for adjustment of structurescopes consists in cutting from blanks with different electro-physical parameters standard samples with parallel-sided surfaces with same thicknesses, measurement of electro-physical structure-sensitive parameter of material of standard sample, with assigning of given value of electro-physical parameter to standard sample. According to the invention, the blanks for standard samples are made of half-finished products, those in process of respective processing gain anisotropic properties. The standard samples are cut of processed blank at different angles with respect to direction of axes of anisotropy. And at measurement of parameters of standard samples respective parameter of anisotropy of sample material is used as an electro-physical structure-sensitive parameter. The blanks for standard samples can be produced by rolling. Specific electric conductivity of standard sample material, or its magnetic characteristic, including coercive force, is used as an electro-physical structure-sensitive parameter. The method provides decrease of labor consumption at production of standard samples.
申请公布号 UA101421(C2) 申请公布日期 2013.03.25
申请号 UA20110009087 申请日期 2011.07.20
申请人 H. KARPENKO PHYSICAL AND MECHANICAL INSTITUTE OF THE NAS OF UKRAINE 发明人 RYBACHUK VOLODYMYR HEORHIIOVYCH;UCHANIN VALENTYN MYKOLAIOVYCH
分类号 G01N27/90 主分类号 G01N27/90
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